Xstress G2R

X-ray diffractometer Xstress G2R represents advances in design and construction, which provide enhanced reliability and function in a truly portable residual stress and retained austenite analyzer. Bi-axial and tri-axial stress state analysis is effortless and automated with rotating diffractometer.

  • Non-destructive
  • Suitable for laboratory, factory and ­field use
  • Rotating diffractometer enables bi-axial and tri-axial stress state analysis
  • Quick assembly, ready to use in 10 minutes
  • Easy replacement of X-ray tube (Cr, Cu, Co, Fe, V, Ti, Mn) which enables measuring different materials
  • Measurement distance 50 mm
  • Two NMOS position sensitive detectors
  • Instantly adjustable 2θ-angle
  • XTronic software for running the measurement and calculating residual stresses and retained austenite content (optional)
  • d-sin²χ and Ω-measurement modes as a standard

Two symmetrically positioned NMOS position sensitive detectors

  • standard detector width 15°
  • for other detectors see options

2θ-range of the detectors

  • continuously adjustable within 110° to 165°
  • lower angles as option with special detector arcs

Standard measurement distance 50 mm

Replaceable collimators

  • 1/2/3/4/5 mm spot sizes
  • special collimators available as an option

X-ray tube

  • Cr-tube as standard: max. output 30 kV/9 mA/270 W

Automated rotation unit

  • Rotation angle range +/-180°
  • Rotation oscillation, automatically selectable +/-180°

Xstress main unit (high voltage generator)

  • X-ray power supply 5–30 kV/0–10 mA freely adjustable within limits
  • self-contained liquid cooling system
  • includes all interlocks required for complete safety
  • universal power input

XTronic software

  • fully featured Windows software using thread based multi-tasking
  • hardware operation control: detectors, DC motors, power supply, shutter, safety interlock functions, voltage and current, etc.
  • automated calibration with zero stress powder samples to set diffractometer to sample distance
  • project manager for depth distribution measurement and all kinds of mapping measurements
  • library functions for material parameters
  • modified d-sin2χ and Ω-mode
  • peak shift determination with the most known methods such as cross-correlation and peak fit methods
  • peak fit with eight different functions and three background options: Gauss, Lorentz, Modified Lorentz, Intermediate Lorentz, Pearson VII, Split Pearson VII, Pseudo-Voigt and Split Pseudo-Voigt
ANSI N43.3 – 1993
  • Meets or exceeds ANSI N43.3 – 1993 and other industry standards for open beam X-ray operation.
  • X-ray diffractometer safety regulations in general
Xstress G2 bearing
Xstress omega mode
X-ray table xstress
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