This state of the art technology offers independent parameter multiplex, allowing various sequentialsettings to optimize results using a single probe. On the other hand the probe multiplexing allows the use of probe arrays to inspect large area test objects fast and efﬁciently.
The high multiplex rate does not present any signiﬁcant limitations to the inspection rate and therefore provides inspections with optimized
resolution rate and test speed in a cost effective way.
TECHNICAL DATA FOR THE BASIC UNIT:
- 4 slots for functional modules (may be upgraded to 16)
- available module types:
– test channel module (may also be used as distance compensation)
– 2 slots Q500 sorting module
– probe multiplex module
– fieldbus I/O-module (Profibus, Device Net etc.)
– parallel I/O-module
– triple counter module